Latest TDL specifications published
The outcomes of the continued work on the TDL within STF 577 at ETSI have been published as updated versions of the specifications:
- ES 203 119-1 1.5.1 TDL: Meta Model
- ES 203 119-2 1.4.1 TDL: Graphical Syntax
- ES 203 119-3 1.4.1 TDL: Exchange Format
- ES 203 119-4 1.4.1 TDL: Structured Test Objective Specification
- ES 203 119-6 1.2.1 TDL: Mapping to TTCN-3
- ES 203 119-7 1.2.1 TDL: Extended Test Configurations
The the latest version of the technical report on the reference implementation of TDL is expected to be published soon as well.
TDL Article at the System Testing and Validation (STV'20) Workshop
We are happy to announce that the article "Using TDL for Standardised Test Purpose Definitions" (preprint by Fraunhofer) is accepted at the 13th IEEE International Workshop on System Testing and Validation (STV'20), co-located with 20th IEEE International Conference on Software Quality, Reliability, and Security (QRS 2020). Within this article, the Structured Test Objective Specification extension for TDL and its application in several contexts related to standardised test purposes are discussed.
TDL Booth at UCAAT 2019
Learn more about TDL at MTS booth at the seventh ETSI User Conference of Advanced Automated Testing (UCAAT) 2019. Join us in Bordeaux from October 22 to October 24. The conference also includes talks and tutorials on numerous other topics related to automated testing and has established itself as a meeting point for testing experts from industry, academia, and standardisation.
TDL Article in the Software Quality Journal
We are happy to announce that the article "Test Descriptions with ETSI TDL" by members of STF 522, ETSI CTI, and ETSI TC MTS has been published in the Springer Software Quality Journal. Within this article, we discuss the latest language design enhancements and the mapping of TDL to TTCN-3, as well as results from pilot application cases in different ETSI standardisation efforts.
TDL Tutorial and Presentation at UCAAT 2018
ETSI invites you to a presentation on "Implementing the Standardised Mapping of TDL to TTCN-3" and an in-depth tutorial "From TDL to TTCN-3" at the sixth ETSI User Conference of Advanced Automated Testing (UCAAT) 2018. Join us in Paris from October 16 to October 18. The conference also includes talks and tutorials on numerous other topics related to automated testing and has established itself as a meeting point for testing experts from industry, academia, and standardisation.